Failure in Time (Abk.: FIT ONE) describes the failure rate of technical components, in particular electronic construction units. A FIT ONE corresponds thereby to a total failure in 10^9 hours.
With the help of the fIT-values of individual construction units the probability of failure of complex devices can be computed. One assumes with the fact the loss of any individual part leads to the failure of the whole equipment. From the sum of the failure rates of the individual parts thus those of the whole equipment results.
Typical fIT-values for bedrahtete electronic construction units are:
| Bauelemeent | fit value |
| Resistance | 1,5 |
| Potentiometer | 200 |
| Ceramic capacitor | 6 |
| Foil condenser | 10 |
| Tantalum Elko | 40 |
| Aluminum Elko | 500 |
| Silicon diode | 3 |
| Silicon power diode | 50 |
| Silicon transistor | 5 |
| Silicon power transistor | 60 |
| Integrated circuit (SSI) | 100 |
| Integrated circuit (MSI/LSI) | 200 |
| Netztrafo, relay | 200 |
| IC base (for each contact) | 10 |
| Plug contact | 10 |
| Soldered connection | 1 |
These values are to be taken only as reference points, since they depending upon source and construction unit are differently indicated around the factor 10. In addition the values depend very strongly on the temperature. The table codes apply at ambient temperature, a rise in temperature around 25 "°C increase tenfold the failure rate. Surface-installed construction units (SMD) have partial substantially more favorable values.
The MTBF, thus the probable time up to the loss of equipment, is the reciprocal value of the sum of the fIT-values of all used construction units.
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