By Electrical Overstress (EOS) one understands the unnoticed overloading and destruction or of electronic construction units. This can take place by means of most diverse errors:

• Wrong sequence when switching on on operating voltages
• Creation of signal voltages without operating voltage
• Short circuit from high frequency tension when measuring DC voltage with a DVM
• Insufficient wiring of voltage regulators

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Articles in category "Electrical Overstress"

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• Automation of electrical overstress characterization for ...
  'Automation of electrical overstress characterization for semiconductor devices' from Hewlett-Packard Journal in Computers & Technology provided free by ...


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  Electrical overstress (EOS) has historically been one of the leading ... In general terms, electrical overstress can be defined as any condition where ...


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  Human body model electrostatic discharge tests and electrical overstress tests were performed to replicate the failures. The studies showed that the failure ...


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• Tutorial- Electrical Overstress and Electrostatic Discharge
  Summary and Conclusions- Semiconductor devices have a limited ability to sustain electrical overstress (EOS). The device susceptibility to EOS increases as ...